| Numéro |
J. Phys. Colloques
Volume 48, Numéro C9, Décembre 1987
X-Ray and Inner-Shell ProcessesVol. 1 |
|
|---|---|---|
| Page(s) | C9-79 - C9-82 | |
| DOI | https://doi.org/10.1051/jphyscol:1987910 | |
X-Ray and Inner-Shell Processes
Vol. 1
J. Phys. Colloques 48 (1987) C9-79-C9-82
DOI: 10.1051/jphyscol:1987910
ATOMKI, Institute of Nuclear Research of the Hungarian Academy of Sciences, Pf. 51, H-4001 Debrecen, Hungary
Vol. 1
J. Phys. Colloques 48 (1987) C9-79-C9-82
DOI: 10.1051/jphyscol:1987910
AN X-RAY CRYSTAL SPECTROMETER FOR ION-INDUCED MULTIPLE IONIZATION STUDIES, PARTICULARLY FOR M SATELLITE STRUCTURE
I. TÖRÖK and B. TÓTHATOMKI, Institute of Nuclear Research of the Hungarian Academy of Sciences, Pf. 51, H-4001 Debrecen, Hungary
Abstract
After the short description of an X-ray crystal spectrometer three measurements are mentioned as examples of its performance : a, relative intensities of Al K alpha and beta satellites ; b, Mg content determination in the presence of much Ca ; c, satellite structure of Ta M alpha and beta lines.