| Numéro |
J. Phys. Colloques
Volume 48, Numéro C6, Novembre 1987
34th International Field Emission Symposium / 34ème Symposium International d'Emission de Champ
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|---|---|---|
| Page(s) | C6-317 - C6-322 | |
| DOI | https://doi.org/10.1051/jphyscol:1987652 | |
34th International Field Emission Symposium / 34ème Symposium International d'Emission de Champ
J. Phys. Colloques 48 (1987) C6-317-C6-322
DOI: 10.1051/jphyscol:1987652
1 The Institute for Solid State Physics, The University of Tokyo, Roppongi, Minato-ku, Tokyo 106, Japan
2 Department of Materials Science and Engineering, Osaka University, Suita, Osaka 565, Japan
J. Phys. Colloques 48 (1987) C6-317-C6-322
DOI: 10.1051/jphyscol:1987652
ATOM-PROBE FIELD-ION MICROSCOPY OF MICRO-CLUSTERS IN AN Ni4Mo ALLOY
T. Hashizume1, M. Yamamoto2 et T. Sakurai11 The Institute for Solid State Physics, The University of Tokyo, Roppongi, Minato-ku, Tokyo 106, Japan
2 Department of Materials Science and Engineering, Osaka University, Suita, Osaka 565, Japan
Abstract
Field evaporation of micro-clusters in a Ni4Mo alloy was studied. When field evaporation was carried out in vacuum, sporadic field evaporation of the surface atoms was frequently observed and the atom-probe analysis resulted in the higher Mo concentration for micro-clusters. We have found that this apparently erroneous composition was caused by simultaneous arrival of more than one ion of the same isotope species at the detector. The appropriate experimental conditions to obtain stoichiometrically correct values of the composition for micro-clusters were then discussed.