Numéro
J. Phys. Colloques
Volume 48, Numéro C6, Novembre 1987
34th International Field Emission Symposium / 34ème Symposium International d'Emission de Champ
Page(s) C6-305 - C6-310
DOI https://doi.org/10.1051/jphyscol:1987650
34th International Field Emission Symposium / 34ème Symposium International d'Emission de Champ

J. Phys. Colloques 48 (1987) C6-305-C6-310

DOI: 10.1051/jphyscol:1987650

FIELD ION MICROSCOPE, IMAGING ATOM PROBE STUDY OF METALLIC GLASSES

H.B. Elswijk, P.M. Bronsveld et J. Th. M. De Hosson

Department of Applied Physics, Materials Science Centre, University of Groningen, Nijenborgh 18, 9747 AG Groningen, The Netherlands


Abstract
The application of a field ion microscope and imaging atom probe to the problem of atomic structure of metallic glasses has been investigated in two systems, Ni40Pd40P20, an amorphous alloy of the type transition metal-metalloid, and FeZr, an alloy system of two transition metals, of which two compositions are studied. The spatial resolution of both techniques does not permit to probe local atomic configurations, but homogeneity on a nm scale and the presence of microcrystallites can be established.