Numéro |
J. Phys. Colloques
Volume 47, Numéro C8, Décembre 1986
EXAFS and Near Edge Structure IV
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Page(s) | C8-437 - C8-472 | |
DOI | https://doi.org/10.1051/jphyscol:1986888 |
EXAFS and Near Edge Structure IV
J. Phys. Colloques 47 (1986) C8-437-C8-472
DOI: 10.1051/jphyscol:1986888
AT&T Bell Laboratories, Murray Hill, NJ 07974, U.S.A.
J. Phys. Colloques 47 (1986) C8-437-C8-472
DOI: 10.1051/jphyscol:1986888
AN OVERVIEW OF SEXAFS DURING THE PAST DECADE
P.H. CITRINAT&T Bell Laboratories, Murray Hill, NJ 07974, U.S.A.
Abstract
The evolution, accomplishments, and impact of the surface extended x-ray absorption fine structure (SEXAFS) technique are presented. Critical evaluations of previous studies and current assessments of experimental methodology, data analysis procedures, and inherent and practical limitations of the method are discussed. Previously unreported correlations are found between simple concepts of ionicity and SEXAFS-measured surface bond lengths and coordination numbers. Emphasis is placed on advancing and improving directions of SEXAFS study using present and future synchrotron sources.