J. Phys. Colloques
Volume 47, Numéro C8, Décembre 1986EXAFS and Near Edge Structure IV
|Page(s)||C8-185 - C8-188|
J. Phys. Colloques 47 (1986) C8-185-C8-188
Ce K-EDGE EXAFS SPECTRUM OF CeO2K. ASAKURA1, Y. SATOW2 et H. KURODA1
1 Research Center for Spectrochemistry and Department of Chemistry, Faculty of Science, the University of Tokyo, Hongo, Tokyo 113, Japan
2 Photon Factory, National Laboratory for High Energy Physics, Oho-machi, Tsukuba-gun, Ibaragi 305, Japan
The Ce K-edge (40 keV) EXAFS of CeO2 was successfully measured by using Si(553) double crystal monochromator and the synchrotron radiation emitted from the Photon Factory wiggler. The energy resolution was estimated to be about 17 eV from the width of the Ce K-edge absorption edge. The distances of Ce-O and Ce-Ce were determined to be 2.28(3) g Å and 3.38(5) Å by using theoretically derived phase shifts. We demonstrated the possibility of elucidating structural parameters from K-edge EXAFS spectra of the atoms with the medium Z values (50 < Z < 60).