| Numéro |
J. Phys. Colloques
Volume 47, Numéro C8, Décembre 1986
EXAFS and Near Edge Structure IV
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|
|---|---|---|
| Page(s) | C8-1197 - C8-1200 | |
| DOI | https://doi.org/10.1051/jphyscol:19868235 | |
EXAFS and Near Edge Structure IV
J. Phys. Colloques 47 (1986) C8-1197-C8-1200
DOI: 10.1051/jphyscol:19868235
1 Department of Chemistry, University of Michigan, Ann arbor, MI 48109-1055, U.S.A.
2 Department of Chemistry, Stanford University, Stanford, CA 94305, U.S.A.
3 Department of Applied Physics, Stanford University, Stanford, CA 94305, U.S.A.
J. Phys. Colloques 47 (1986) C8-1197-C8-1200
DOI: 10.1051/jphyscol:19868235
POLARIZED X-RAY ABSORPTION NEAR EDGE STRUCTURE
J.E. PENNER-HAHN1, T.A. SMITH2, B. HEDMAN2, K.O. HODGSON2 et S. DONIACH31 Department of Chemistry, University of Michigan, Ann arbor, MI 48109-1055, U.S.A.
2 Department of Chemistry, Stanford University, Stanford, CA 94305, U.S.A.
3 Department of Applied Physics, Stanford University, Stanford, CA 94305, U.S.A.
Abstract
Polarized measurements of oriented single crystals can be used to simplify the interpretation of X-ray absorption near edge structure (XANES) spectra by permitting a direct determination of the symmetry properties of a particular transition. We have utilized this technique to study the XANES spectra for several first-row transition metal complexes. Applications to the weak, 1s→3d transition, to intense near edge features, and to continuum transitions are discussed.