| Numéro |
J. Phys. Colloques
Volume 47, Numéro C8, Décembre 1986
EXAFS and Near Edge Structure IV
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|
|---|---|---|
| Page(s) | C8-883 - C8-886 | |
| DOI | https://doi.org/10.1051/jphyscol:19868171 | |
EXAFS and Near Edge Structure IV
J. Phys. Colloques 47 (1986) C8-883-C8-886
DOI: 10.1051/jphyscol:19868171
1 Department of Applied Physics, University of Strathclyde, GB-Glasgow G4 0NG (Scotland), Great-Britain
2 CNSM and Physics Department, University of Modena, I-41100 Modena, Italy
3 SERC Daresbury Laboratory, GB-Warrington WA4 4AD, Great-Britain
4 Physics Division, JRC, I-21020 Ispra (VA), Italy
J. Phys. Colloques 47 (1986) C8-883-C8-886
DOI: 10.1051/jphyscol:19868171
DEPTH CONTROLLED EXAFS AND NEAR EDGE SPECTROSCOPY TO STUDY SURFACE LAYER STRUCTURE
F.R. THORNLEY1, G.M. ANTONINI2, G.N. GREAVES3 et N.T. BARRETT41 Department of Applied Physics, University of Strathclyde, GB-Glasgow G4 0NG (Scotland), Great-Britain
2 CNSM and Physics Department, University of Modena, I-41100 Modena, Italy
3 SERC Daresbury Laboratory, GB-Warrington WA4 4AD, Great-Britain
4 Physics Division, JRC, I-21020 Ispra (VA), Italy
Abstract
Calculated and experimental intensity values are presented and compared for EXAFS spectrometry at grazing incidence with fluorescence or reflectivity detection, and samples in the form of single or double metal films evaporated onto flat glass substrates.