J. Phys. Colloques
Volume 47, Numéro C8, Décembre 1986EXAFS and Near Edge Structure IV
|Page(s)||C8-861 - C8-864|
J. Phys. Colloques 47 (1986) C8-861-C8-864
A REFLECTIVITY AND EXAFS STUDY OF LAYERED STRUCTURESD. JIANG, N. ALBERDING, A.J. SEARY et E.D. CROZIER
Physics Department, Simon Fraser University, Burnaby, B.C. V5A 1S6, Canada
By combining the total reflection of x-rays incident on a sample at grazing angles and fluorescent detection of the EXAFS signal, it is possible, in principle, to examine the interfacial and bulk regions of layered structures. In this paper we first describe a simple sample positioner that permits a rapid, precise aliment of the sample. It is driven by stepper motors controlled by an microcomputer and permits an angular step of 0.07 mrad. A reflectivity curve can be obtained with it in less than one minute. Using this apparatus good agreement is obtained between experiment and theory for the angular dependence of the reflectivity of a multilayer film of Si/Cu/Au deposited on fused quartz. We also report structural results as a function of depth obtained via fluorescent reflection EXAFS for Ni epitaxially grown on the (100) face of a Fe single crystal.