Numéro
J. Phys. Colloques
Volume 47, Numéro C7, Novembre 1986
33rd International Field Emission Symposium / 33ème Symposium International d'Emission de Champ
Page(s) C7-459 - C7-462
DOI https://doi.org/10.1051/jphyscol:1986777
33rd International Field Emission Symposium / 33ème Symposium International d'Emission de Champ

J. Phys. Colloques 47 (1986) C7-459-C7-462

DOI: 10.1051/jphyscol:1986777

A COMBINED TEM/FIM EXAMINATION OF FIELD EMISSION AS A FIM SPECIMEN PREPARATION TECHNIQUE

M.G. BURKE, D.D. SIELOFF et S.S. BRENNER

Department of Materials Science and Engineering, University of Pittsburgh, Pittsburgh, PA 15261, U.S.A.


Abstract
It is well-known that 'blunt' FIM needle specimens can be resharpened via an 'in-situ' field emission technique and thereby extend the life of the specimen without removing it from the microscope. We have examined of tip morphology on the resharpening process by using TEM and FIM. Examples of successfully resharpened specimens will be presented.