Numéro
J. Phys. Colloques
Volume 47, Numéro C7, Novembre 1986
33rd International Field Emission Symposium / 33ème Symposium International d'Emission de Champ
Page(s) C7-275 - C7-280
DOI https://doi.org/10.1051/jphyscol:1986747
33rd International Field Emission Symposium / 33ème Symposium International d'Emission de Champ

J. Phys. Colloques 47 (1986) C7-275-C7-280

DOI: 10.1051/jphyscol:1986747

FIM-ATOM PROBE STUDIES OF THE DECOMPOSITION IN THE METALLIC GLASS Ni45 Pd35 P20

M. OEHRING et P. HAASEN

Institut für Metallphysik der Universität Göttingen, D-3400 Göttingen, F.R.G. and Sonderforschungsbereich 126, D-3392 Clausthal-Zellerfeld, (Göttingen), F.R.G.


Abstract
A Field Ion Microscope (FIM) combined with an Atom Probe (AP) was used to study decomposition in the metallic glass Ni45 Pd35 P20. As-quenched specimens are found to be homogeneous whereas isothermally annealed specimens show phosphorous enrichment of small concentration amplitudes and diameters. Two glass temperatures are observed in annealed specimens. The temper embrittlement in this glass must be caused by crystallisation, not by decomposition.