| Numéro |
J. Phys. Colloques
Volume 47, Numéro C2, Mars 1986
32 nd International Field Emission Symposium / 32ème Symposium International d'Emission de Champ
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|---|---|---|
| Page(s) | C2-409 - C2-415 | |
| DOI | https://doi.org/10.1051/jphyscol:1986263 | |
32 nd International Field Emission Symposium / 32ème Symposium International d'Emission de Champ
J. Phys. Colloques 47 (1986) C2-409-C2-415
DOI: 10.1051/jphyscol:1986263
1 Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, U.S.A.
2 Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, U.S.A.
J. Phys. Colloques 47 (1986) C2-409-C2-415
DOI: 10.1051/jphyscol:1986263
A COMPARISON OF CHARACTERISTIC DISTANCE MEASUREMENTS BY AP, TEM AND SANS
M.K. MILLER1, L.L. HORTON1 et SPOONER21 Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, U.S.A.
2 Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, U.S.A.
Abstract
Characteristic distance measurements of a spinodally decomposed isotropic microstructure obtained from field-ion and transmission electron micrographs, from analysis of atom probe composition profiles and from small angle neutron scattering data are compared. The results are in general agreement although there are significant differences in the manner in which the phase transformation and the aging time affect the measurements with the various instruments.