| Numéro |
J. Phys. Colloques
Volume 47, Numéro C2, Mars 1986
32 nd International Field Emission Symposium / 32ème Symposium International d'Emission de Champ
|
|
|---|---|---|
| Page(s) | C2-281 - C2-285 | |
| DOI | https://doi.org/10.1051/jphyscol:1986242 | |
32 nd International Field Emission Symposium / 32ème Symposium International d'Emission de Champ
J. Phys. Colloques 47 (1986) C2-281-C2-285
DOI: 10.1051/jphyscol:1986242
1 Department of Metallurgy and Science of Materials, University of Oxford, Parks Road, GB-Oxford 0X1 3PH, Great Britain
2 1, Story Street, Parkville, Victoria 3052, Australia
J. Phys. Colloques 47 (1986) C2-281-C2-285
DOI: 10.1051/jphyscol:1986242
FIELD ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF Nb3 Sn WIRES
J.D. ROSE1, M.J. GORINGE1, G.D.W. SMITH1 et A.J.W. MOORE21 Department of Metallurgy and Science of Materials, University of Oxford, Parks Road, GB-Oxford 0X1 3PH, Great Britain
2 1, Story Street, Parkville, Victoria 3052, Australia
Abstract
Nb3Sn compound superconductor wires have been imaged in the field ion microscope for the first time. Comparison of the observed images with computer-simulated patterns indicates that tin atoms image more brightly than niobium in the ordered structure. Atom probe microanalysis of a grain boundary region showed enrichment in both tin and copper, the latter element being present as an impurity from the "Bronze Process" route used in fabrication. The results are important for understanding both the method of flux pinning and also the mechanism of crystal growth of the material.