J. Phys. Colloques
Volume 46, Numéro C10, Décembre 1985Eighth International Conference on Internal Friction and Ultrasonic Attenuation in Solids
|Page(s)||C10-493 - C10-496|
J. Phys. Colloques 46 (1985) C10-493-C10-496
MECHANICAL RELAXATION BY MOBILE IONS (Cu+ AND Ag+) IN FAST ION CONDUCTING GLASSESC. LIU and C.A. ANGELL
Department of Chemistry, Purdue University, West Lafayette, IN 47907, U.S.A.
The dissipation of mechanical energy in glasses of the "fast ion conductor" type (AgI-AgPO3, AgI-AgBO2 and AgCl-CsI) has been studied using a Rheovibron mechanical analyzer in the temperature range -190 to 200°C. In most cases a single loss peak at low temperature is found for fixed-frequency scans. The peak temperature almost coincides with that for electrical conductivity relaxation but is much broader. The loss magnitude does not correlate with peak temperature but depends on glass constitution. Where loss is small, the relaxation time follows Arrhenius Law with τ0 = 1/2πf0, where f0 is found from far IR spectra. For large loss glasses, important non-Arrhenius behavior is found.