| Numéro |
J. Phys. Colloques
Volume 46, Numéro C4, Avril 1985
International Conference on the Structure and Properties of Internal Interfaces
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|---|---|---|
| Page(s) | C4-129 - C4-133 | |
| DOI | https://doi.org/10.1051/jphyscol:1985415 | |
International Conference on the Structure and Properties of Internal Interfaces
J. Phys. Colloques 46 (1985) C4-129-C4-133
DOI: 10.1051/jphyscol:1985415
Max-Planck-Institut für Metallforschung, Institut für Werkstoffwissenschaften, Seestrasse 92, D-7000 Stuttgart 1, F.R.G.
J. Phys. Colloques 46 (1985) C4-129-C4-133
DOI: 10.1051/jphyscol:1985415
HREM AND DIFFRACTION STUDIES OF AN Al2O3/Nb INTERFACE
M. Florjancic, W. Mader, M. Rühle et M. TurwittMax-Planck-Institut für Metallforschung, Institut für Werkstoffwissenschaften, Seestrasse 92, D-7000 Stuttgart 1, F.R.G.
Abstract
Single crystals of Nb and Al2O3 were welded so that close-packed planes of both materials were parallel. Thin specimens (suitable for TEM) containing the interface were prepared out of the bulk bicrystal. The thickness of the foil was ~ 5 to 10 nm. HREM studies allowed the direct imaging of the interface. No pronounced intermediate layer (e.g., oxid, spinel) could be determined between the two constituents near the interface. Small deviations from the exact orientation of the interface are accomodated by facets. The diffraction pattern revealed pronounced streaks close to the diffraction spots of Nb. The shapes and positions of the streaks may allow the determination of the width of the distorted region.