| Numéro |
J. Phys. Colloques
Volume 44, Numéro C6, Octobre 1983
Spectroscopie Photoacoustique et Photothermique / Photoacoustic and Photothermal Spectroscopy
|
|
|---|---|---|
| Page(s) | C6-497 - C6-502 | |
| DOI | https://doi.org/10.1051/jphyscol:1983681 | |
Spectroscopie Photoacoustique et Photothermique / Photoacoustic and Photothermal Spectroscopy
J. Phys. Colloques 44 (1983) C6-497-C6-502
DOI: 10.1051/jphyscol:1983681
1 B.P. Oil, Inc., and Laboratory for Laser Energetics, University of Rochester, 250 East River Road, Rochester, New York 14623, U.S.A.
2 B.P. Oil, Inc., and Laboratory for Laser Energetics, University of Rochester, 250 East River Road, Rochester, New York 14623, U.S.A.
J. Phys. Colloques 44 (1983) C6-497-C6-502
DOI: 10.1051/jphyscol:1983681
SPATIALLY RESOLVED ABSORPTION AND DETECTION OF MICROSCOPIC IMPURITIES IN OPTICAL THIN FILMS BY PHOTOTHERMAL DETECTION
J.A. Abate1 et R. Roides21 B.P. Oil, Inc., and Laboratory for Laser Energetics, University of Rochester, 250 East River Road, Rochester, New York 14623, U.S.A.
2 B.P. Oil, Inc., and Laboratory for Laser Energetics, University of Rochester, 250 East River Road, Rochester, New York 14623, U.S.A.
Résumé
On décrit une méthode de mesure d'absorption résolue spatiallement qui permet la localisation d'impuretés absorbantes dans des films diélectriques. Une corrélation entre les sites absorbants et les dommages est établie partiellement.
Abstract
Spatially resolved absorption measurements allowing for the location of micron size absorbing impurities in dielectric thin films using photothermal detection is described. A partial correlation between localized absorption sites and damage is made.