Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

This article has been cited by the following article(s):

The influence of the measurement setup on enhanced AC hot carrier degradation of MOSFETs

R. Bellens, P. Heremans, G. Groeseneken, H.E. Maes and W. Weber
IEEE Transactions on Electron Devices 37 (1) 310 (1990)
DOI: 10.1109/16.43834
See this article