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Atom Probe Tomography on Semiconductor Devices

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Advanced Materials Interfaces 3 (12) 1500713 (2016)
DOI: 10.1002/admi.201500713
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Atom Probe Tomography of Electronic Materials

Thomas F. Kelly, David J. Larson, Keith Thompson, Roger L. Alvis, Joseph H. Bunton, Jesse D. Olson and Brian P. Gorman
Annual Review of Materials Research 37 (1) 681 (2007)
DOI: 10.1146/annurev.matsci.37.052506.084239
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Metrology and Diagnostic Techniques for Nanoelectronics

Thomas Kelly and Karen Henry
Metrology and Diagnostic Techniques for Nanoelectronics 711 (2016)
DOI: 10.1201/9781315185385-16
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Nanoscale Measurement of Laser-Induced Temperature Rise and Field Evaporation Effects in CdTe and GaN

David R. Diercks and Brian P. Gorman
The Journal of Physical Chemistry C 119 (35) 20623 (2015)
DOI: 10.1021/acs.jpcc.5b02126
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Springer Handbook of Microscopy

Thomas F. Kelly
Springer Handbooks, Springer Handbook of Microscopy 715 (2019)
DOI: 10.1007/978-3-030-00069-1_15
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