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Cited article:

LBIC QUANTITATIVE MAPPING

J.P. BOYEAUX, A. LAUGIER

J. Phys. Colloques, 50 C6 (1989) C6-111-C6-127

DOI: https://doi.org/10.1051/jphyscol:1989610

PDF (1.699 MB)

This article has been cited by the following article(s):

Electrical characterisation of thin silicon layers by light beam induced current and internal quantum efficiency measurements

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Materials Science and Engineering: B 165 (1-2) 67 (2009)
https://doi.org/10.1016/j.mseb.2009.04.007

J.P. Boyeaux, A. Kaminski, N. Ferrer, S. Berger and A. Laugier
319 (2000)
https://doi.org/10.1109/PVSC.2000.915827