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Cited article:

MOLECULAR SPUTTERING AND DAMAGE INDUCED BY keV IONS IN MULTILAYERED LANGMUIR-BLODGETT FILMS

G. BOLBACH, R. GALERA, J.C. BLAIS

J. Phys. Colloques, 50 C2 (1989) C2-69-C2-74

DOI: https://doi.org/10.1051/jphyscol:1989213

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This article has been cited by the following article(s):

The spike formation probability in sputtering of solids under keV ion bombardment

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Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 83 (1-2) 110 (1993)
https://doi.org/10.1016/0168-583X(93)95914-Q

Analysis of Langmuir-Blodgett overlayers by time-of-flight secondary ion mass spectrometry (TOF-SIMS)

B Hagenhoff, M Deimel, A Benninghoven, H -U Siegmund and D Holtkamp
Journal of Physics D: Applied Physics 25 (5) 818 (1992)
https://doi.org/10.1088/0022-3727/25/5/012

Liquid matrices for liquid secondary ion mass spectrometry–fast atom bombardment: An update

E. De Pauw, A. Agnello and F. Derwa
Mass Spectrometry Reviews 10 (4) 283 (1991)
https://doi.org/10.1002/mas.1280100402