Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

Potential sources of compositional inaccuracy in the atom probe tomography of InxGa1-xAs

Ramya Cuduvally, Richard J.H. Morris, Piero Ferrari, et al.
Ultramicroscopy 210 112918 (2020)
https://doi.org/10.1016/j.ultramic.2019.112918

Nanoscale Measurement of Laser-Induced Temperature Rise and Field Evaporation Effects in CdTe and GaN

David R. Diercks and Brian P. Gorman
The Journal of Physical Chemistry C 119 (35) 20623 (2015)
https://doi.org/10.1021/acs.jpcc.5b02126

Three-Dimensional Mapping of Quantum Wells in a GaN/InGaN Core–Shell Nanowire Light-Emitting Diode Array

James R. Riley, Sonal Padalkar, Qiming Li, et al.
Nano Letters 13 (9) 4317 (2013)
https://doi.org/10.1021/nl4021045

Atom Probe Tomography of a-Axis GaN Nanowires: Analysis of Nonstoichiometric Evaporation Behavior

James R. Riley, Rodrigo A. Bernal, Qiming Li, et al.
ACS Nano 6 (5) 3898 (2012)
https://doi.org/10.1021/nn2050517

Chemical mapping of mammalian cells by atom probe tomography

Kedar Narayan, Ty J. Prosa, Jing Fu, Thomas F. Kelly and Sriram Subramaniam
Journal of Structural Biology 178 (2) 98 (2012)
https://doi.org/10.1016/j.jsb.2011.12.016

Atom Probe Analysis of III–V and Si-Based Semiconductor Photovoltaic Structures

Brian P. Gorman, Andrew G. Norman and Yanfa Yan
Microscopy and Microanalysis 13 (6) 493 (2007)
https://doi.org/10.1017/S1431927607070894

Progress in the Atomic-Scale Analysis of Materials with the Three-Dimensional Atom Probe

A. Cerezo, D. J. Larson and G. D. W. Smith
MRS Bulletin 26 (2) 102 (2001)
https://doi.org/10.1557/mrs2001.296

Design of a scanning atom probe with improved mass resolution

A. Cerezo, T. J. Godfrey, M. Huang and G. D. W. Smith
Review of Scientific Instruments 71 (8) 3016 (2000)
https://doi.org/10.1063/1.1304877

Preparation of (InGa)As/GaAs materials for TEM by one side non‐rotation ion beam thinning

J. Y. Yao and G. L. Dunlop
Journal of Electron Microscopy Technique 19 (1) 90 (1991)
https://doi.org/10.1002/jemt.1060190109

Application of position sensitive atom probe to the study of the microchemistry and morphology of quantum well interfaces

J. A. Liddle, A. G. Norman, A. Cerezo and C. R. M. Grovenor
Applied Physics Letters 54 (16) 1555 (1989)
https://doi.org/10.1063/1.101328