INTERFACE STATE GENERATION IN NMOS TRANSISTORS DURING HOT CARRIER STRESS AT LOW TEMPERATURES
J. Phys. Colloques, 49 C4 (1988) C4-669-C4-672
Articles citing this article
The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).
Cited article:
This article has been cited by the following article(s):
Hot Carrier Design Considerations for MOS Devices and Circuits
P. Heremans, R. Bellens, G. Groeseneken, et al.Hot Carrier Design Considerations for MOS Devices and Circuits 1 (1992)
https://doi.org/10.1007/978-1-4684-8547-9_1