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Cited article:

High-resolution X-ray diffraction and micro-Raman scattering studies of Ge(:Ga) thin films grown on GaAs (001) substrates by MOCVD

H. F. Liu, Y. J. Jin, C. G. Li, et al.
RSC Advances 6 (58) 52575 (2016)
https://doi.org/10.1039/C6RA10348K