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Cited article:

AP-FIM STUDY OF Si OXIDE AND Si-Si OXIDE INTERFACE

T. ADACHI, M. TOMITA, T. KURODA, S. NAKAMURA

J. Phys. Colloques, 47 C7 (1986) C7-315-C7-319

DOI: https://doi.org/10.1051/jphyscol:1986754

PDF (1.524 MB)

This article has been cited by the following article(s):

The Prospect of Spatially Accurate Reconstructed Atom Probe Data Using Experimental Emitter Shapes

Jonathan Op de Beeck, Jeroen E Scheerder, Brian P Geiser, et al.
Microscopy and Microanalysis 28 (4) 1141 (2022)
https://doi.org/10.1017/S143192762101357X