HIGH SPATIAL RESOLUTION SIMS WITH THE UC-HRL SCANNING ION MICROPROBE
J. Phys. Colloques, 45 C9 (1984) C9-197-C9-205
Articles citing this article
The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).
Cited article:
This article has been cited by the following article(s):
High spatial resolution mass spectrometry imaging for spatial metabolomics: Advances, challenges, and future perspectives
Siyuan Ma, Yixin Leng, Xiaoping Li, Yifan Meng, Zhibin Yin and Wei HangTrAC Trends in Analytical Chemistry 116902 (2022)
https://doi.org/10.1016/j.trac.2022.116902
Electrohydrodynamic emitters of ion beams
P Mazarov, V G Dudnikov and A B TolstoguzovPhysics-Uspekhi 63 (12) 1219 (2020)
https://doi.org/10.3367/UFNe.2020.09.038845
Electrohydrodynamic emitters of ion beams
Paul A. Mazarov, Vadim G. Dudnikov and Aleksandr B. TolstoguzovUspekhi Fizicheskih Nauk 190 (12) 1293 (2020)
https://doi.org/10.3367/UFNr.2020.09.038845
NanoSIMS for biological applications: Current practices and analyses
Jamie Nuñez, Ryan Renslow, John B. Cliff and Christopher R. AndertonBiointerphases 13 (3) (2018)
https://doi.org/10.1116/1.4993628
The Encyclopedia of Mass Spectrometry
Nicholas WinogradThe Encyclopedia of Mass Spectrometry 103 (2016)
https://doi.org/10.1016/B978-0-08-043848-1.00013-4
Bright focused ion beam sources based on laser-cooled atoms
J. J. McClelland, A. V. Steele, B. Knuffman, et al.Applied Physics Reviews 3 (1) 011302 (2016)
https://doi.org/10.1063/1.4944491
Biological Low-Voltage Scanning Electron Microscopy
James B. PawleyBiological Low-Voltage Scanning Electron Microscopy 27 (2008)
https://doi.org/10.1007/978-0-387-72972-5_2
Mass spectrometry on the nanoscale with ion sputtering based techniques: What is feasible
Igor V. Veryovkin, Wallis F. Calaway, C. Emil Tripa and Michael J. PellinNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 261 (1-2) 508 (2007)
https://doi.org/10.1016/j.nimb.2007.04.058
Improvements in SIMS continue
Nicholas Winograd, Zbigniew Postawa, Juan Cheng, et al.Applied Surface Science 252 (19) 6836 (2006)
https://doi.org/10.1016/j.apsusc.2006.02.142
Ion beams and their applications in high-resolution probe formation
S.K. Guharay, J. Orloff and M. WadaIEEE Transactions on Plasma Science 33 (6) 1911 (2005)
https://doi.org/10.1109/TPS.2005.860086
Encyclopedia of Imaging Science and Technology
Riccardo Levi‐Setti and Konstantin L. GavrilovEncyclopedia of Imaging Science and Technology (2002)
https://doi.org/10.1002/0471443395.img027
Emission properties of a dual ion/electron source based on Au–In alloy
B. L. Sheu and Y. L. WangApplied Physics Letters 80 (8) 1480 (2002)
https://doi.org/10.1063/1.1453484
Nanoscale elemental imaging of semiconductor materials using focused ion beam secondary ion mass spectrometry
F. A. Stevie, S. W. Downey, S. R. Brown, et al.Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 17 (6) 2476 (1999)
https://doi.org/10.1116/1.591115
Stable field-induced electron emission from a solidified liquid metal ion source
L. W. Chen and Y. L. WangApplied Physics Letters 72 (3) 389 (1998)
https://doi.org/10.1063/1.120745
Operation of a single column focused ion/electron beam system based on a dual ion/electron source
L. W. Chen and Y. L. WangApplied Physics Letters 73 (15) 2212 (1998)
https://doi.org/10.1063/1.122426
Morphological changes of Si(100) induced by focused ion beam irradiation
J.B. Wang, A. Datta and Y.L. WangApplied Surface Science 135 (1-4) 129 (1998)
https://doi.org/10.1016/S0169-4332(98)00285-2
Spatial and temporal scaling of oxide cluster aggregation on a liquid-gallium surface
Y. L. Wang and S. J. LinPhysical Review B 53 (10) 6152 (1996)
https://doi.org/10.1103/PhysRevB.53.6152
High-resolution chemical imaging with scanning ion probe SIMS
J.M. Chabala, K.K. Soni, J. Li, K.L. Gavrilov and R. Levi-SettiInternational Journal of Mass Spectrometry and Ion Processes 143 191 (1995)
https://doi.org/10.1016/0168-1176(94)04119-R
Direct measurements of room-temperature oxygen diffusion inYBa2Cu3Ox
R. Mogilevsky, R. Levi-Setti, B. Pashmakov, et al.Physical Review B 49 (9) 6420 (1994)
https://doi.org/10.1103/PhysRevB.49.6420
Scanning ion microprobe analysis of composite materials
D. B. WILLIAMS, K. K. SONI, M. W. TSENG, J. M. CHABALA and R. LEVI‐SETTIJournal of Microscopy 169 (2) 163 (1993)
https://doi.org/10.1111/j.1365-2818.1993.tb03291.x
Microelectronics and Microscopy
James B. PawleyAdvances in Electronics and Electron Physics, Microelectronics and Microscopy 83 203 (1992)
https://doi.org/10.1016/S0065-2539(08)60008-6
Liquid metal ion sources and their applications
G.L.R. MairInternational Journal of Mass Spectrometry and Ion Processes 114 (1-2) 1 (1992)
https://doi.org/10.1016/0168-1176(92)85018-U
Oxide-growth kinetics and fractal-like patterning across liquid gallium surfaces
Jan M. ChabalaPhysical Review B 46 (18) 11346 (1992)
https://doi.org/10.1103/PhysRevB.46.11346
Sputtering by Particle Bombardment III
Klaus WittmaackTopics in Applied Physics, Sputtering by Particle Bombardment III 64 161 (1991)
https://doi.org/10.1007/3540534288_18
Critical issues in the application of a gallium probe to high resolution secondary ion imaging
R. Levi-Setti, P. Hallégot, C. Girod, et al.Surface Science 246 (1-3) 94 (1991)
https://doi.org/10.1016/0039-6028(91)90399-D
A design of large current ion gun employing liquid metal ion source
Yuzo Mori, Hui Wang, Katsuyoshi Endo, Kazuto Yamauchi and Takashi IdeReview of Scientific Instruments 61 (7) 1874 (1990)
https://doi.org/10.1063/1.1141111
Graphite Intercalation Compounds I
Dah-Min David HwangSpringer Series in Materials Science, Graphite Intercalation Compounds I 14 247 (1990)
https://doi.org/10.1007/978-3-642-75270-4_7
Microanalysis of precipitates in aluminum-lithium alloys with a scanning ion microprobe
D.B. Williams, R. Levi-Setti, J.M. Chabala, Y.L. Wang and D.E. NewburyApplied Surface Science 37 (1) 78 (1989)
https://doi.org/10.1016/0169-4332(89)90975-6
Chemical characterization of electronic microstructures with sub-100 nm lateral resolution
Riccardo Levi-Setti, Jan M. Chabala, Philippe Hallegot and Yuh-Lin WangMicroelectronic Engineering 9 (1-4) 391 (1989)
https://doi.org/10.1016/0167-9317(89)90086-5
Velocity and work-function dependence of secondary-ion emission
Yuh-Lin WangPhysical Review B 38 (13) 8633 (1988)
https://doi.org/10.1103/PhysRevB.38.8633
Practical resolution limits of imaging microanalysis with a scanning ion microprobe
J.M. Chabala, R. Levi-Setti and Y.L. WangApplied Surface Science 32 (1-2) 10 (1988)
https://doi.org/10.1016/0169-4332(88)90071-2
Focused ion‐beam milling of a submicrometer aperture for a hydrodynamic Josephson‐effect experiment
P. Sudraud, P. Ballongue, E. Varoquaux and O. AvenelJournal of Applied Physics 62 (6) 2163 (1987)
https://doi.org/10.1063/1.339517
Secondary Ion Mass Spectrometry SIMS V
R. E. HonigSpringer Series in Chemical Physics, Secondary Ion Mass Spectrometry SIMS V 44 2 (1986)
https://doi.org/10.1007/978-3-642-82724-2_1
High-Resolution Scanning-Ion-Microprobe Study of Graphite and its Intercalation Compounds
R. Levi-Setti, G. Crow, Y. L. Wang, et al.Physical Review Letters 54 (24) 2615 (1985)
https://doi.org/10.1103/PhysRevLett.54.2615