Articles citing this article

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Cited article:

Determination of grain‐boundary parameters of polycrystalline silicon by ac electron‐beam‐induced current

A. Romanowski and D. B. Wittry
Journal of Applied Physics 64 (9) 4601 (1988)
https://doi.org/10.1063/1.341238

Measurement of carrier lifetime, effective recombination velocity, and diffusion length near the grain boundary using the time-dependent electron-beam-induced current

A. Romanowski and D. B. Wittry
Journal of Applied Physics 60 (8) 2910 (1986)
https://doi.org/10.1063/1.337077