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Cited article:

MICROANALYSIS TECHNIQUE USING ELECTRON ENERGY LOSS SPECTROSCOPY IN HIGH VOLTAGE ELECTRON MICROSCOPY

J. Sevely, Y. Kihn, G. Zanchi, B. Jouffrey

J. Phys. Colloques, 45 C2 (1984) C2-441-C2-444

DOI: https://doi.org/10.1051/jphyscol:19842100

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This article has been cited by the following article(s):

Ratio between the energy-loss spectrum in coincidence with secondary electrons and the normal energy-loss spectrum for thin carbon films in the carbonK-edge region

Harald Müllejans and Andrew L. Bleloch
Physical Review B 46 (13) 8597 (1992)
https://doi.org/10.1103/PhysRevB.46.8597