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Cited article:

X-RAY STUDIES RELATED TO COATING THICKNESS MEASUREMENTS

D.A. Sewell, I.D. Hall, G. Love, J.P. Partridge, V.D. Scott

J. Phys. Colloques, 45 C2 (1984) C2-33-C2-36

DOI: https://doi.org/10.1051/jphyscol:1984208

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This article has been cited by the following article(s):

Fundamentals of X-ray Spectrometric Analysis Using Low-Energy Electron Excitation

K. J. Romand, F. Gaillard, M. Charbonnier and D. S. Urch
Advances in X-ray Analysis 34 105 (1990)
https://doi.org/10.1154/S0376030800014373