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Cited article:

SOME EXAMPLES OF QUANTITATIVE E.B.I.C. MODE FOR THE STUDY OF THE ELECTRICAL PROPERTIES OF DISLOCATIONS IN SEMICONDUCTOR DEVICES

J.F. Bresse

J. Phys. Colloques, 44 C4 (1983) C4-465-C4-468

DOI: https://doi.org/10.1051/jphyscol:1983455

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This article has been cited by the following article(s):

Determination of grain‐boundary parameters of polycrystalline silicon by ac electron‐beam‐induced current

A. Romanowski and D. B. Wittry
Journal of Applied Physics 64 (9) 4601 (1988)
https://doi.org/10.1063/1.341238