Articles citing this article

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The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

The remote electron beam-induced current analysis of grain boundaries in semiconducting and semi-insulating materials

D. B. Holt
Scanning 22 (1) 28 (2006)
https://doi.org/10.1002/sca.4950220106

Electrical activity of the first‐ and second‐order twins and grain boundaries in silicon

A. Bary and G. Nouet
Journal of Applied Physics 63 (2) 435 (1988)
https://doi.org/10.1063/1.340259