Articles citing this article

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Cited article:

Modeling and Experimental Verification of the Currents Diffusion and Recombination: Application to Mono and Polycrystalline Silicon

M. Khalis and R. Masrour
Transactions on Electrical and Electronic Materials 20 (5) 459 (2019)
https://doi.org/10.1007/s42341-019-00130-w

A particular case of electronic behaviour of the Sigma =3 grain boundary in p-type Si

D S Kyriakos, A N Anagnostopoulos, Ph Komninou and B Ploss
Semiconductor Science and Technology 6 (7) 607 (1991)
https://doi.org/10.1088/0268-1242/6/7/007

Electrical activity of the first‐ and second‐order twins and grain boundaries in silicon

A. Bary and G. Nouet
Journal of Applied Physics 63 (2) 435 (1988)
https://doi.org/10.1063/1.340259