The Citing articles tool gives a list of articles citing the current article. The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).
This article has been cited by the following article(s):
Effect of Disorder and Defects in Ion-Implanted Semiconductors: Electrical and Physicochemical Characterization
G. Mütter, S. Kalbitzer and G.N. Greaves Semiconductors and Semimetals, Effect of Disorder and Defects in Ion-Implanted Semiconductors: Electrical and Physicochemical Characterization 45 85 (1997) https://doi.org/10.1016/S0080-8784(08)62676-9
Measurements of depletion layers in hydrogenated amorphous silicon