Articles citing this article

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Cited article:

Effect of Disorder and Defects in Ion-Implanted Semiconductors: Electrical and Physicochemical Characterization

G. Mütter, S. Kalbitzer and G.N. Greaves
Semiconductors and Semimetals, Effect of Disorder and Defects in Ion-Implanted Semiconductors: Electrical and Physicochemical Characterization 45 85 (1997)
https://doi.org/10.1016/S0080-8784(08)62676-9

Carrier lifetimes in amorphous silicon junctions from delayed and interrupted field experiments

W. E. Spear, H. L. Steemers and H. Mannsperger
Philosophical Magazine Part B 48 (5) L49 (1983)
https://doi.org/10.1080/13642818308228575