Issue
J. Phys. Colloques
Volume 50, Number C8, Novembre 1989
36th International Field Emission Symposium
Page(s) C8-73 - C8-78
DOI https://doi.org/10.1051/jphyscol:1989813
36th International Field Emission Symposium

J. Phys. Colloques 50 (1989) C8-73-C8-78

DOI: 10.1051/jphyscol:1989813

ELECTRON EMISSION FROM SMALL MICROTIPS

J. J. SÁENZ1, 2, N. GARCÍA1, 2, H. DE RAEDT3 et VU THIEN BINH4

1  IBM Zurich Research Laboratories, CH-8803 Rüschlikon, Switzerland
2  Dept. Materia Condensada, Univ. Autónoma de Madrid, Cantoblanco, SP-28049 Madrid, Spain
3  Physics Dept., Univ. of Antwerp, Universiteitsplein 1, B-2610 Wilrijk, Belgium
4  Departement de Physique des Matériaux (UA CNRS), Université Claude Bernard - Lyon 1, F-69622 Villeurbanne, France


Abstract
Electron field emission calculations on atomic-size microtips are presented. Models inorporating the atomic size and the particular geometrical shape of the tip are proposed. Theoretical analysis explain the remarkable properties observed experimentally : strong electron beam focusing and anomalous I-V characteristics. We present a first series of experiments and quantum mechanical calculations that suggest the possibility of atomic resolution in Electron Field Emission.