| Issue |
J. Phys. Colloques
Volume 50, Number C7, Octobre 1989
X-ray and Neutron Scattering from Surfaces and Thin FilmsProceedings of the International Conference on Surface and Thin Film studies using Glancing-Incidence X-ray and Neutron Scattering |
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|---|---|---|
| Page(s) | C7-203 - C7-206 | |
| DOI | https://doi.org/10.1051/jphyscol:1989721 | |
X-ray and Neutron Scattering from Surfaces and Thin Films
Proceedings of the International Conference on Surface and Thin Film studies using Glancing-Incidence X-ray and Neutron Scattering
J. Phys. Colloques 50 (1989) C7-203-C7-206
DOI: 10.1051/jphyscol:1989721
Institut Laue-Langevin, BP 156X, F-38042 Grenoble Cedex, France
Proceedings of the International Conference on Surface and Thin Film studies using Glancing-Incidence X-ray and Neutron Scattering
J. Phys. Colloques 50 (1989) C7-203-C7-206
DOI: 10.1051/jphyscol:1989721
TRANSMISSION MEASUREMENTS UNDER GLANCING-INCIDENCE CONDITIONS
F. RIEUTORDInstitut Laue-Langevin, BP 156X, F-38042 Grenoble Cedex, France
Résumé
Nous présentons une méthode permettant la mesure du coefficient de transmission d'une surface ou d'un film mince pour les rayons X et les neutrons. La géométrie de l'expérience est décrite ainsi que les résultats obtenus sur un film multicouche déposé sur un substrat de silicium.
Abstract
We present a method allowing the measurement of the transmission coefficient of a surface or a thin film for X-rays and neutrons. The geometry of the experiment is described as well as results obtained on a multilayer film deposited on a silicon substrate.