| Issue |
J. Phys. Colloques
Volume 50, Number C1, Janvier 1989
International Conference on the Physics of Multiply Charged Ions and International Workshop on E.C.R. Ion Sources
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| Page(s) | C1-379 - C1-386 | |
| DOI | https://doi.org/10.1051/jphyscol:1989144 | |
International Conference on the Physics of Multiply Charged Ions and International Workshop on E.C.R. Ion Sources
J. Phys. Colloques 50 (1989) C1-379-C1-386
DOI: 10.1051/jphyscol:1989144
1 Institute of Physics, University of Aarhus, DK-8000 Aarhus, Denmark
2 Boris Kidric Institute of Nuclear Science, Belgrade, Yugoslavia and FOM-institute for Atomic and Molecular Physics, Amsterdam, The Netherlands
3 Kernfysisch Versneller Instituut, Groningen, The Netherlands
J. Phys. Colloques 50 (1989) C1-379-C1-386
DOI: 10.1051/jphyscol:1989144
X-RAY EMISSION FROM ELECTRON CAPTURE INTO 2.4-9 keV/amu O7+, O8+, Ne8+ and Ne9+
F. FOLKMANN1, N.H. EISUM1, D. CIRIC2 and A.G. DRENTJE31 Institute of Physics, University of Aarhus, DK-8000 Aarhus, Denmark
2 Boris Kidric Institute of Nuclear Science, Belgrade, Yugoslavia and FOM-institute for Atomic and Molecular Physics, Amsterdam, The Netherlands
3 Kernfysisch Versneller Instituut, Groningen, The Netherlands
Abstract
With a curved crystal spectrometer x rays emitted from ions from an ECR ion source have been measured after they have passed a gas, from which they capture electrons to specific states. High resolution results are presented for 96 keV 18O8+, 75 keV O7+, 108 keV Ne9+ and for 48, 107 and 160 keV Ne8+ on He and H2 gas targets, and for 107 keV Ne8+ on Ne, Ar, O2 and CH4.