| Issue |
J. Phys. Colloques
Volume 49, Number C8, Décembre 1988
Proceedings of the International Conference on Magnetism
|
|
|---|---|---|
| Page(s) | C8-1993 - C8-1994 | |
| DOI | https://doi.org/10.1051/jphyscol:19888904 | |
Proceedings of the International Conference on Magnetism
J. Phys. Colloques 49 (1988) C8-1993-C8-1994
DOI: 10.1051/jphyscol:19888904
1 Institute of Physics, Czechoslovak Academy of Sciences, Na Slovance 2, CS-180 40 Praha 8, Czechoslovakia
2 University of Twente, P.O.B. 217, NL-7500 AE Enschede, The Netherlands
J. Phys. Colloques 49 (1988) C8-1993-C8-1994
DOI: 10.1051/jphyscol:19888904
THE FIELD DEPENDENCE OF THE DOMAIN PERIOD IN CoCr FILMS
J. Kaczér1, J. Simsová1, R. Gemperle1, L. Murtinová1 et J. C. Lodder21 Institute of Physics, Czechoslovak Academy of Sciences, Na Slovance 2, CS-180 40 Praha 8, Czechoslovakia
2 University of Twente, P.O.B. 217, NL-7500 AE Enschede, The Netherlands
Abstract
The dependence of the submicron domain period of CoCr films in ascending and descending fields (dc : 8-320kA/m ; superposed ac : 0-55 kA/m) normal to the surface was investigated using the colloid-SEM method. Low coercivity samples (Hc/Hk ~ 0.02) were measured. Comparison with calculations furnished fair agreement in contradistinction to samples havig Hc/Hk ~ 0.05. The exchange constant A was deterrnined from the thickness dependence of the domain period.