| Issue |
J. Phys. Colloques
Volume 48, Number C6, Novembre 1987
34th International Field Emission Symposium / 34ème Symposium International d'Emission de Champ
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| Page(s) | C6-269 - C6-274 | |
| DOI | https://doi.org/10.1051/jphyscol:1987644 | |
J. Phys. Colloques 48 (1987) C6-269-C6-274
DOI: 10.1051/jphyscol:1987644
FIM AND ATOM-PROBE STUDY OF POLYMERS
T. Maruyama1, Y. Hasegawa2, T. Nishi1 et T. Sakurai21 Department of Applied Physics, The University of Tokyo, Bunkyo-ku, Tokyo, Japan
2 The Institute for Solid State Physics (ISSP), The University of Tokyo, Minato-ku, Tokyo, Japan
Abstract
A field ion microscope makes it possible to observe the surface structures of metals and semiconductors at the atomic level and an atom-probe (FIM), which is a FIM with a mass spectrometer, has been widely used to study the chemical compositions of specimens. Some attempts were made previously to visualize polymers such as biological molecules. They are usually insulators and, thus, are difficult to be imaged by the FIM. Furthermore, molecules are known to decompose or desorb before a needed high field is reached. In the present study, we have used conductive plolymers (polypyrrole) as a specimen and have explored the possibility of visualizing a polymer with atomic resolution using an imaging atom-probe. The atom-probe analysis has also been carried out to detect monomer, dimer and trimer species.