| Issue |
J. Phys. Colloques
Volume 48, Number C6, Novembre 1987
34th International Field Emission Symposium / 34ème Symposium International d'Emission de Champ
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|---|---|---|
| Page(s) | C6-79 - C6-84 | |
| DOI | https://doi.org/10.1051/jphyscol:1987613 | |
J. Phys. Colloques 48 (1987) C6-79-C6-84
DOI: 10.1051/jphyscol:1987613
COMBINED FIELD ION AND SCANNING TUNNELING MICROSCOPE
T. Sakurai1, T. Hashizurne1, I. Kamiya1, Y. Hasegawa1, A. Sakai1, A. Kobayashi1, J. Matsui2, S. Takahashi2, E. Kono2 et H. Watanabe21 The Institute for Solid State Physics 7-22-1 Roppongi, Minato-ku, Tokyo, Japan
2 NEC Corporation, Miyamae-ku, Kawasaki, Japan
Abstract
Realizing the importance of characterizing a STM probe tip on an atomic scale, we have constructed a new instrument which combines a field ion microscope and scanning tunneling microscope. A complete STM set-up, which is similar to the one developed by Demuth, is mounted on an 8" O.D. flange and a FIM set-up is mounted on a 10" O.D. flange. FI images of the STM probe tip are observed using a 2" O.D. chevron channelplate-image intensifier screen assembly with liquid nitrogen cooling. A field necessary for field ionization of He imaging gas is provided through a negative electrode placed near the probe tip so that the high voltage system is completely separated from the STM system. A preliminary data is presented for the graphite (0001) plane in vacuum.