| Issue |
J. Phys. Colloques
Volume 47, Number C8, Décembre 1986
EXAFS and Near Edge Structure IV
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|
|---|---|---|
| Page(s) | C8-841 - C8-844 | |
| DOI | https://doi.org/10.1051/jphyscol:19868161 | |
EXAFS and Near Edge Structure IV
J. Phys. Colloques 47 (1986) C8-841-C8-844
DOI: 10.1051/jphyscol:19868161
Center for Materials Research, 105 McCullough Building, Stanford University, Stanford, CA 94305-4045, U.S.A.
J. Phys. Colloques 47 (1986) C8-841-C8-844
DOI: 10.1051/jphyscol:19868161
EXAMINATION OF Ti XANES SPECTRA OF MINERALS AND SOLIDS : EFFECTS OF SITE GEOMETRY ON SPECTRAL FEATURES
G.A. WAYCHUNASCenter for Materials Research, 105 McCullough Building, Stanford University, Stanford, CA 94305-4045, U.S.A.
Abstract
The X-ray absorption near edge structure of Ti in 16 oxides and silicates has been collected and analyzed by computer fitting Gaussian lines to the spectral envelopes. Comparison of feature intensities and energies with geometric site parameters reveals that the near edge changes systematically with site symmetry variation and mean Ti-O bond length.