| Issue |
J. Phys. Colloques
Volume 47, Number C7, Novembre 1986
33rd International Field Emission Symposium / 33ème Symposium International d'Emission de Champ
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| Page(s) | C7-429 - C7-434 | |
| DOI | https://doi.org/10.1051/jphyscol:1986772 | |
33rd International Field Emission Symposium / 33ème Symposium International d'Emission de Champ
J. Phys. Colloques 47 (1986) C7-429-C7-434
DOI: 10.1051/jphyscol:1986772
Department of Materials Science and Engineering, The Graduate School at Nagatsuta, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 227, Japan
J. Phys. Colloques 47 (1986) C7-429-C7-434
DOI: 10.1051/jphyscol:1986772
ATOM-PROBE STUDY OF POLYPYRROLE : DISTRIBUTION OF DOPANTS AND OXYGEN
H. KATO, S. UCHIKOGA et O. NISHIKAWADepartment of Materials Science and Engineering, The Graduate School at Nagatsuta, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 227, Japan
Abstract
The atom-probe analysis of BF4--doped polypyrrole (PP) revealed that the fresh PP layer polymerized electrochemically on a Pt tip has two regions : B-rich region and B-free region at the initial stage of oxidation. The thickness of these regions are found to be a few tens angstroms. The observed non-uniform B distribution can be attributed to the intrinsic profile of the fresh PP layer. The exclusion of boron from the fully oxidized PP layer may indicate the repulsive B-O interaction.