| Issue |
J. Phys. Colloques
Volume 47, Number C7, Novembre 1986
33rd International Field Emission Symposium / 33ème Symposium International d'Emission de Champ
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| Page(s) | C7-7 - C7-9 | |
| DOI | https://doi.org/10.1051/jphyscol:1986702 | |
33rd International Field Emission Symposium / 33ème Symposium International d'Emission de Champ
J. Phys. Colloques 47 (1986) C7-7-C7-9
DOI: 10.1051/jphyscol:1986702
1 Fritz-Haber-Institut der Max-Planck-Gesellschaft, Faradayweg 4-6, D-1000 Berlin 33, F.R.G.
2 On leave from Dalian Institut of Chemical Physics, Chinese Academy of Sciences, Dalian, P.R. China
J. Phys. Colloques 47 (1986) C7-7-C7-9
DOI: 10.1051/jphyscol:1986702
ATOM-PROBE SPECTROSCOPY OF FIELD ADSORBED He AND Ne
N. ERNST1, W. DRACHSEL1, Y. LI2, G. BOZDECH1 et J.H. BLOCK11 Fritz-Haber-Institut der Max-Planck-Gesellschaft, Faradayweg 4-6, D-1000 Berlin 33, F.R.G.
2 On leave from Dalian Institut of Chemical Physics, Chinese Academy of Sciences, Dalian, P.R. China
Abstract
An electric field of the order of volts per Angström applied to the emitter-tip in a field-ion microscope induces the adsorption of He and Ne on metal surfaces at temperatures above 80 K /1/. To contribute to an improved understanding of this field enhanced binding, two experimental methods including probe-hole field ion microscopy are applied : (a) pulsed LASER induced (thermal) field desorption with subsequent time-of-flight mass analysis of the ions /2/ and (b) electron-stimulated field desorption of adsorbates as singly and multiply charged ions, which are mass analysed in a magnetic sector field and energy analysed in a retarding potential filter lens /3/.