Issue
J. Phys. Colloques
Volume 47, Number C5, Août 1986
International Workshop on Evaluation of Single-Crystal Diffraction Data from 2-D Position-Sensitive Detectors
Page(s) C5-157 - C5-166
DOI https://doi.org/10.1051/jphyscol:1986521
International Workshop on Evaluation of Single-Crystal Diffraction Data from 2-D Position-Sensitive Detectors

J. Phys. Colloques 47 (1986) C5-157-C5-166

DOI: 10.1051/jphyscol:1986521

REAL-TIME REDUCTION OF AREA DETECTOR DATA BY HARDWARE (DACOM) FOR STATIC AND TIME-RESOLVED CRYSTALLOGRAPHY

H.D. BARTUNIK1, C. BOULIN2 et H. SCHWAB3

1  European Molecular Biology Laboratory, c/o DESY, Notkestrasse 85, D-2000 Hamburg 52, F.R.G.
2  European Molecular Biology Laboratory, Meyerhofstrasse, D-6900 Heidelberg, F.R.G.
3  Institut Laue-Langevin, 156 X, F-38042 Grenoble Cedex, France


Abstract
A data handling system ("DACOM") has been developed for high counting rate (of, at present, 1 MHz and eventually 10 MHz) diffraction data collection with quantum counting or integrating area detectors using synchrotron radiation and for on-line data evaluation in real time. DACOM data handling is done by hardware including look-up tables programmed on the basis of pattern prediction. DACOM may be applied in protein crystallography, both in static studies involving very short exposure and overall measuring times, and in (usec to msec) time-resolved data collection. Results of a test application are described.