| Issue |
J. Phys. Colloques
Volume 47, Number C2, Mars 1986
32 nd International Field Emission Symposium / 32ème Symposium International d'Emission de Champ
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| Page(s) | C2-381 - C2-387 | |
| DOI | https://doi.org/10.1051/jphyscol:1986259 | |
32 nd International Field Emission Symposium / 32ème Symposium International d'Emission de Champ
J. Phys. Colloques 47 (1986) C2-381-C2-387
DOI: 10.1051/jphyscol:1986259
1 The Institute for Solid State Physics, The University of Tokyo, Minato-ku, Tokyo, Japan
2 The Department of Materials Science and Engineering, The Pennsylvania State University, The University park, Pa 16802, U. S.A.
J. Phys. Colloques 47 (1986) C2-381-C2-387
DOI: 10.1051/jphyscol:1986259
ATOM-PROBE STUDY OF SURFACE SEGREGATION OF Ni-Cu ALLOYS
T. HASHIZUME1, T. SAKURAI1 et H.W. PICKERING21 The Institute for Solid State Physics, The University of Tokyo, Minato-ku, Tokyo, Japan
2 The Department of Materials Science and Engineering, The Pennsylvania State University, The University park, Pa 16802, U. S.A.
Abstract
A focusing-type ToF atom-probe has been designed and constructed successfully, with superb features, such as 100 % detection efficiency and precise alignment of a probing area. Using this instrument, surface segregation of the Ni-Cu alloy system was investigated in detail. Experimental evidence are presented for solute Ni segregation to the surface, contrary to the general belief that Cu atoms always segregate to the surface. A new insight is needed in surface segregation to account for this observation of Ni segregation in Ni1-xCux alloys where x is 0.84 to 1.