Issue
J. Phys. Colloques
Volume 42, Number C5, Octobre 1981
ICIFUAS-7
Seventh International Conference on Internal Friction and Ultrasonic Attenuation in Solids
Page(s) C5-1111 - C5-1122
DOI https://doi.org/10.1051/jphyscol:19815172
ICIFUAS-7
Seventh International Conference on Internal Friction and Ultrasonic Attenuation in Solids

J. Phys. Colloques 42 (1981) C5-1111-C5-1122

DOI: 10.1051/jphyscol:19815172

DEFECT STUDIES OF THIN LAYERS BY THE VIBRATING-REED TECHNIQUE

B.S. Berry et W.C. Pritchet

IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598, U.S.A.


Abstract
The vibrating-reed technique has been successfully adapted to internal friction studies of thin-layer materials. Three examples are described, related to the oxygen contamination of niobium films, grain-boundary sliding of aluminum films, and anelasticity due to hydrogen in metallic glasses. Emphasis is given to the use of thin high-Q substrates as a means of examining supported films down to 0.1µm thickness. It has been found that the behavior of films can be radically different from that of bulk samples. For example, two-stage grain-boundary sliding with an activation energy of only 0.55eV has been observed in aluminum films. In metallic glasses, a peak associated with the presence of hydrogen in small low-symmetry interstitial sites has been found in many different alloys, including Pd80Si20, Fe80B20, Nb40Ni60 and Cu57Zr43.