| Issue |
J. Phys. Colloques
Volume 40, Number C7, Juillet 1979
XIVe Conférence Internationale sur les Phénomènes d'Ionisation dans les Gaz / XIVth International Conference on Phenomena in Ionized Gases
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|---|---|---|
| Page(s) | C7-311 - C7-312 | |
| DOI | https://doi.org/10.1051/jphyscol:19797153 | |
XIVe Conférence Internationale sur les Phénomènes d'Ionisation dans les Gaz / XIVth International Conference on Phenomena in Ionized Gases
J. Phys. Colloques 40 (1979) C7-311-C7-312
DOI: 10.1051/jphyscol:19797153
1 Electrical Engineering Dep., Faculty of Engineering, Cairo University, Cairo Egypt.
2 Electrical Mech. Res. Inst., Ministry of Irrigation, Cairo, Egypt.
J. Phys. Colloques 40 (1979) C7-311-C7-312
DOI: 10.1051/jphyscol:19797153
STATIC BREAKDOWN ANALYSIS OF COMPRESSED SF6 IN POSITIVE ROD-TO-PLANE GAPS
M.S. Abou-Seada1 et KH. I. M. Ali21 Electrical Engineering Dep., Faculty of Engineering, Cairo University, Cairo Egypt.
2 Electrical Mech. Res. Inst., Ministry of Irrigation, Cairo, Egypt.
Abstract
The peculiar variation of breakdown voltage Vs with pressure P in compressed SF6 due to corona-stabilization of the applied field is well pronounced in rod-to-plane gaps, Fig. 1(a ). In this paper a theoretical analysis of this stabilization effect is conducted. Accordingly a criterion is developed for computing Vs of compressed SF6 in rod-to-plane gaps.