| Issue |
J. Phys. Colloques
Volume 40, Number C2, Mars 1979
International Conference on The Applications of The Mössbauer Effect
|
|
|---|---|---|
| Page(s) | C2-72 - C2-73 | |
| DOI | https://doi.org/10.1051/jphyscol:1979224 | |
International Conference on The Applications of The Mössbauer Effect
J. Phys. Colloques 40 (1979) C2-72-C2-73
DOI: 10.1051/jphyscol:1979224
1 Institute for Solid State Physics, University of Tokyo, Roppongi, Tokyo 106, Japan
2 Department of Physics, Tohoku University, Sendai 980, Japan
J. Phys. Colloques 40 (1979) C2-72-C2-73
DOI: 10.1051/jphyscol:1979224
NEUTRON DIFFRACTION STUDIES ON THE INTERFACE MAGNETIZATION OF Fe-SiO MULTILAYER
M. Sato1, K. Abe1 and Y. Endoh21 Institute for Solid State Physics, University of Tokyo, Roppongi, Tokyo 106, Japan
2 Department of Physics, Tohoku University, Sendai 980, Japan
Résumé
L'aimantation d'atomes de fer et de nickel placés aux interfaces de films multiples de SiO a été étudiée par diffraction neutronique. Les résultats obtenus sont comparables à ceux fournis par la spectrométrié Mössbauer de films multiples Fe-MgF2. Le moment magnétique de Ni semble disparaître à la température ambiante.
Abstract
Magnetization of Fe or Ni at the interface of SiO has been studied by the neutron diffraction from the Fe-SiO or Ni-SiO multilayered films. Our results are consistent with the Mössbauer results of Fe-MgF2 multilayered films, while the magnetic moment of Ni at the interface seems to depress at the room temperature.