Supplément au Journal de Physique Colloques

SOME ASPECTS OF THE SCANNING ACOUSTIC MICROSCOPE CONTRIBUTIONS IN THE EVALUATION OF DEVICE RELIABILITY

A. SAIED, C. AMAUDRIC DU CHAFFAUT, J.M. SAUREL and J. ATTAL

J. Phys. Colloques, 49 C4 (1988) C4-801-C4-804

DOI: 10.1051/jphyscol:19884168

A. SAIED

C. AMAUDRIC DU CHAFFAUT

J.M. SAUREL

J. ATTAL

Articles written by ALL the selected authors (AND)

Articles written by ANY OF the selected authors (OR)