Supplément au Journal de Physique Colloques

THE IMPACT OF DIFFERENT HOT-CARRIER-DEGRADATION COMPONENTS ON THE OPTIMIZATION OF SUBMICRON n-CHANNEL LDD TRANSISTORS

P.T.J. BIERMANS, T. POORTER and H.J.H. MERKS-EPPINGBROEK

J. Phys. Colloques, 49 C4 (1988) C4-787-C4-790

DOI: 10.1051/jphyscol:19884165

P.T.J. BIERMANS

T. POORTER

H.J.H. MERKS-EPPINGBROEK

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