Supplément au Journal de Physique Colloques

MICROANALYSIS TECHNIQUE USING ELECTRON ENERGY LOSS SPECTROSCOPY IN HIGH VOLTAGE ELECTRON MICROSCOPY

J. Sevely, Y. Kihn, G. Zanchi and B. Jouffrey

J. Phys. Colloques, 45 C2 (1984) C2-441-C2-444

DOI: 10.1051/jphyscol:19842100

J. Sevely

Y. Kihn

G. Zanchi

B. Jouffrey

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