Supplément au Journal de Physique Colloques

0

Subscriber Authentication Point

EDPS Account

Rechercher

Menu

NUCLEAR SCATTERING MEASUREMENTS OF COMPOSITION PROFILES IN a-Si : H MULTILAYER STRUCTURES

C. Brassard, R. Groleau, J. L'Ecuyer, J.P. Martin, J.F. Currie, P. Depelsenaire, M. Wertheimer and A. Yelon

J. Phys. Colloques, 42 C4 (1981) C4-795-C4-798

DOI: 10.1051/jphyscol:19814174

C. Brassard

R. Groleau

J. L'Ecuyer

J.P. Martin

J.F. Currie

P. Depelsenaire

M. Wertheimer

A. Yelon

Articles written by ALL the selected authors (AND)

Articles written by ANY OF the selected authors (OR)

Copyright / Publiée par : EDP Sciences