CHARACTERISATION OF NANOMETER-SCALE EPITAXIAL STRUCTURES BY GRAZING-INCIDENCE X-RAY SCATTERING T. W. RYAN, C. LUCAS, P. D. HATTON et S. BATESJ. Phys. Colloques, 48 C5 (1987) C5-109-C5-111DOI: https://doi.org/10.1051/jphyscol:1987519
